Intel/Rochester Research Review - March 13, 2000


For downloading are the six parts of the Intel/Rochester Research Review (IRRR - 3/00).

  • Intel/Rochester Research Review: Introduction IRRR - 3/00 Part 1

  • An Equivalent RLC Elmore Delay Model: IRRR - 3/00 Part 2

  • Figures of Merit for RLC Trees: IRRR - 3/00 Part 3

  • Delay Uncertainty Caused by Transient IR Drops and On-Chip Simultaneous Switching Noise: IRRR - 3/00 Part 4

  • A Model for the Effective Coupling Capacitance based on Signal Activities: IRRR - 3/00 Part 5

  • Summary and Other Research Topics: IRRR - 3/00 Part 6