Metrology, microscopy and measurements

Measurements of polarization, spatial coherence, and applications in microscopy. Measurements of nanostructures using structured focused illumination.

Polarization microscopy and imaging polarimetry

Journal articles

• V. Curcio, L.A. Alemán-Castañeda, T.G. Brown, S. Brasselet and M.A. Alonso, “Birefringent Fourier filtering for single molecule Coordinate and Height super-resolution Imaging with Dithering and Orientation,” Nature Commun. 11, 5307 (2020).
• A. Vella and M.A. Alonso, “Optimal birefringence distributions for imaging polarimetry,” Opt. Express 27, 36799-36814 (2019). 
• S. Sivankutti, E.R. Andresen, G. Bowmans, T.G. Brown, M.A. Alonso, and H. Rigneault, “Single shot polarimetry of multicore fiber,” Opt. Lett. 41, 2105-2108 (2016).
• R. Ramkhalawon, T.G. Brown, and M.A. Alonso, “Imaging the polarization of a light field,” Opt. Express 21, 4106-4115 (2013).

Conference proceedings

• B.G. Zimmerman, R. Ramkhalawon, M.A. Alonso, and T.G. Brown, “Pinhole array implementation of Star Test Polarimetry,” Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXI, SPIE proceeding 8949, 894912 (2014).

Measurements of phase

Journal articles

• L.A. Aleman-Castaneda, B. Piccirillo, E. Santamato, L. Marrucci, and M.A. Alonso, “Shearing interferometry via geometric phase,” Optica 6, 396-399 (2019).
• T. Malhotra, R. Gutiérrez-Cuevas, J. Hassett, N. Vamivakas, and M.A. Alonso, “Measuring geometric phase without interferometry,” Phys. Rev. Lett. 120, 233602 (2018).
• S. Sivankutty, V. Tsvirkun, G. Bouwmans, E.R. Andresen, D. Oron, H. Rigneault, and M.A. Alonso, “Single-shot noninterferometric measurement of the phase transmission matrix in multicore fibers,” Opt. Lett. 43, 4493-4496 (2018).

Focused beam scatterometry

Journal Articles

• A. Vella, S.T. Head, T.G. Brown, and M.A. Alonso, “Simultaneous measurement of multiple parameters of a subwavelength structure based on the weak value formalism,” Phys. Rev. Lett. 122, 123603 (2019).

Conference proceedings

• T.G. Brown, M.A. Alonso, A. Vella, M.J. Theisen, S.T. Head, S.R. Gillmer, and J.D. Ellis, “Focused beam scatterometry for deep subwavelength metrology,” Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXI, SPIE proceeding 8949, 89490Y (2014).
• T.G. Brown, M.A. Alonso, A. Vella, M.J. Theisen, and S.T. Head “Weak measurements applied to process monitoring using focused beam scatterometry,” Metrology, Inspection, and Process Control for Microlithography XXVIII, SPIE proceeding 9050, 90501F (2014).

Simple non-interferometric methods for the measurement of spatial coherence

Journal articles

• K.A. Sharma, G. Costello, E. Vélez-Juárez, T.G. Brown, and M.A. Alonso, “Measuring vector field correlations using diffraction,” Opt. Express 26, 8301-8313 (2018).
• K.A. Sharma, T.G. Brown, and M.A. Alonso, “Phase-space approach to lensless measurements of optical field correlations,” Opt. Express 24, 16099-16110 (2016).
• J.K. Wood, K.A. Sharma, S. Cho, T.G. Brown, and M.A. Alonso, “Using shadows for measuring spatial coherence,” Opt. Lett. 39, 4927-4930 (2014).
• S. Cho, M.A. Alonso, and T.G. Brown, “Measurement of spatial coherence through diffraction from a transparent mask with a phase discontinuity” Opt. Lett. 37, 2724-2726 (2012).
• S. Cho and M.A. Alonso, “Ambiguity function and phase space tomography for nonparaxial fields,” J. Opt. Soc. Am. A 28, 897-902 (2011).

Conference proceedings

• M.A. Alonso, S. Cho and T.G. Brown, “Simple methods for measuring spatial coherence and their relation to the Wigner function,” IEEE Proceedings of the 11th Euro-American Workshop on Information Optics, 1-3 (2012).

Theory of measurement

Journal articles

• M.A. Alonso and A.N. Jordan, “Can a Dove prism change the past of a single photon?,” Quantum Stud.: Math. Found. (2015).
• M.A. Alonso, “Measurement of Helmholtz wave fields,” J. Opt. Soc. Am. A 17, 1256-1264 (2000).

Book chapters

• A. Vella and M.A. Alonso, “Maximum likelyhood estimation in the context of an optical measurement”, Chapter 7 of Progress in Optics 65 (Elsevier, Amsterdam, 2020), pp. 231-311.